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conference & short course (fwd)
Bonnie Blackwell, x 3332 (bonn@QCVAXA.ACC.QC.EDU)
Mon, 23 Jan 1995 08:47:14 EDT
Two messages attached
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From: IN%"bessie_argyropoulos@ccmail.chin.doc.ca" 10-JAN-1995 10:44:47.71
Subj: gilded metal surfaces symposium
Dear colleagues,
The American Institute for Conservation is organizing a
symposium on gilded metal surfaces, which will take place
June 4-6, 1995 in St. Paul, Minnesota. I've enclosed
the preliminary schedule. Those interested can write to the
following address for more information:
American Institute for Conservation
1717 K St. N.W. Suite 301
Washington D.C., 20006
Tel: 202-452-9545
Fax: 202-452-9328
June 4, 1994
Session 1
8:45-9:00 Introductory remarks and announcements
9:00-9:50 Andrew Oddy, The history of gilding
10:00-10:50 U. M. Franklin, Gilding in the context of
society
10:50-11:15 Discussion and coffee break
11:15-12:00 Lyndsie Selwyn, The corrosion science of gilded
metal surfaces
Session 2
1:30-2:00 David Scott, A review of gilding techniques in
ancient South America
2:15-2:45 Paul Jett, Ancient Chinese gilded metals
3:00-3:30 Ryo Murakami, Surface characterization of Japanese
archaeological gilded metal objects
3:45-4:00 Coffee break
4:00-4:30 Peter Northover, Romano-British archaeological
gilded metals
4:45-5:15 Alice Paterakis, Gilded bronze sculpture in the
Athenian Agora
5:15-5:30 Discussion
Session 3
8:45-9:00 Introductory remarks
9:00-9:30 Richard Newman and Susanne Gansicke, Ancient
gilded silver from Nubia
9:45-10:15 Peter Dandridge, Cold Amalgam gilding in
Byzantium
10:30-10:45 Coffee Break
10:45-11:30 Andrew Lins, Gilding in the decorative arts and
sculpture
11:45-12:15 Sally Malenka, On the use of mercury compound in
gold electroplating
Session 4
2:00-2:30 To be announced, Gilding of architectural elements
2:45-3:15 Linda Merk-Gould, Gilding turn of the century
monumental sculptures--D.C. French's quest to preserve or to
beautify?
3:30-4:00 To be announced
4:15-4:45 Brian Considine, Gilding and imitation gilding on
furniture
Session 5
8:45-9:00 Introductory announcements
9:00-9:30 C. Degrigny and C. Vacquie, Electrolytic
treatment of gilt silver tarnished by atmospheric corrosion
9:45-10:15 Jack Flotte, "The Sun" by Richard Lippold,
technical investigation and treatment
10:30-11:15 Richard Wolbers, Removing coatings from gilded
metal surfaces
11:15-12:00 Closing remarks
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From: MX%"qmlist@tbone.biol.scarolina.edu" 4-JAN-1995 05:16:42.82
Announcement
Short Course and Workshop on
Computer-Assisted Image Analysis and Measurement
May 16-18, 1995
McKimmon Center for Continuing Education
North Carolina State University, Raleigh, NC
June 12-15, 1995
Danish Teknologisk Institute
Taastrup, Denmark
This course is intended to familiarize users of image analysis equipment
with the fundamental principles and methods available to obtain meaningful
results, and to educate laboratory supervisors or research professionals
seeking to learn how to use such methods in their applications. The
techniques are applicable to fields ranging from materials, geological and
biological research to food technology and manufacturing quality control.
The course relies heavily on tightly coupled lectures and hands-on
experience with the various techniques. The laboratory includes a variety
of image analysis programs selected to offer a wide range of approaches and
tools, and a detailed set of practical instructions to enable their use
with a minimal learning curve. No specific background is assumed, although
users should already be familiar with microscopy or other imaging
technology, and the techniques required to obtain the images to be
measured. Many of the examples used in the course involve light or electron
microscope images, but students are invited to bring their own most
interesting images for discussion and analysis.
Image analysis and measurement methods are used in a broad range of
applications, from satellite images to industrial quality control of
macroscopic manufactured items, to light and electron microscopy of
materials structures, biological , geological or archaeological specimens,
integrated circuits, and so forth. Generally, these methods are concerned
with extracting a few numerical values, such as the number, size, shape or
location of objects from the image. This may require image processing to
correct defects or enhance some aspect of the image, comparison of multiple
images, recognition of the objects of interest in a complex environment, or
other steps. Ultimately, the image is reduced to just the features of
interest, which may then require further editing, for instance to separate
touching objects.
Measurements on these individual features, or on the image as a whole, must
then be obtained and interpreted in a proper stereological context to
obtain useful data about the objects. The procedures are different for
section images, such as cut surfaces that transect objects at random, and
for projected images that show shadow outlines of the objects. Statistical
interpretation of the data allows comparisons of different populations,
understanding of distribution plots, and other inferences about the
original objects. Structural modeling and geometric probability can be used
to develop models for this interpretation. All of these aspects of image
analysis are dealt with in depth by experts in the field.
In addition to the use of stereological interpretation of conventional
two-dimensional images to obtain information about the three dimensional
structure which they sample, there are a variety of three-dimensional
techniques now coming into use. These include stereoscopy (fusion of two
images whose parallax reveals depth information), surface texture
measurements, serial section reconstruction, and tomographic
reconstruction. To date, most of the use of these methods has been limited
to the visual integration of data and its representation to the human
observer, but it is possible to perform measurements on these 3-D images as
well, and this course brings attendees up to the state of the art in these
new methods.
Faculty
U. S. Session (Tuesday May 16-Thursday May 18)
Dr. John C. Russ, Dept. of Materials Science and Eng., North Carolina State
Univ.
Dr. Robert T. DeHoff, Dept. of Materials Science and Eng., Univ. of Florida
Dr. Jeanette Norden, Dept. of Cell Biology, Vanderbilt University
European Session (Monday June 12 - Thursday June 15)
Dr. John C. Russ, Dept. of Materials Science and Eng., North Carolina State
Univ.
Dr. Hans J. Gundersen, Stereological Research Lab, Univ. of Arhus, Arhus,
Denmark
Dr. Leif H jslet Christensen, Dept. of Chemistry, Danish Teknologisk Inst.,
Taastrup, Denmark
The two sessions of the course are identical in their subjects and methods,
with extensive hands-on opportunities and coverage of the latest
techniques. The European session of the course runs three-and-a-half days
(the US session runs three days) in order to provide more hands on time to
deal with both Macintosh and Windows environments (the US session uses
Macintosh computers for the lab sessions), and to allow more discussion
time, since the course is taught in English.
The course includes hands-on exposure to the various techniques, with
experts available to demonstrate and assist in applying methods related to
the lectures. The lab sessions are conducted primarily on Macintosh
computers, with a rich set of images and software. The latter includes
programs such as NIH Image, Photoshop, IPLab, PrismView, Image Analyst,
Enhance, Digital Micrograph, MacLispix, MacStereology, Stereology Toolbox,
Spyglass Transform and Dicer, VoxelView, Morph, and various utilities for
working with images and Quicktime movies. The European course additionally
includes Windows programs such as PhotoStyler, microVision, Image-Pro Plus,
Global Lab, Mocha, and Optimas. A step-by-step "cookbook" guides users
through the use and comparison of these programs. Lab assistants are
available to help with the use of the programs, so that attendees' time can
be spent on learning methods and algorithms.
This course has been offered for 12 years in the U.S. and 2 in Europe, and
has received enthusiastic and highly favorable reviews from the attendees.
The course is consistently filled up well in advance, so early registration
is strongly encouraged. This is a very concentrated and cost-effective way
to learn about the various aspects of image analysis and measurement, to
apply and compare methods selecting from a variety of image analysis
packages, and to meet and discuss these subjects with experts in the field.
Applications to a variety of materials, minerals, industrial quality
control, biological and medical, and other types of samples are covered.
Attendees are encouraged to bring their own samples or images of interest.
Course materials (the widely-praised reference book "The Image Processing
Handbook - second edition", plus notes, offprints and worksheets) provide a
thorough introduction and guide to the literature in this field. Tuition is
US$925 for the US course, and DKr 9000 for the longer European course (DKr
7500 for registrations made before January 31, 1995). Attendance is limited
to assure a high ratio of instructors and instruments to students. For
reservations or other information (including registration forms and a more
detailed course outline), contact Belinda Niedwick, Department of Lifelong
Education, North Carolina State University, Raleigh, NC 27695 (phone
919-515-2261, fax 919-515-7614) or Bente Danielsen at Dansk Teknologisk
Institut, DK 2630 Taastrup, Denmark (+45 43 50 43 50, fax +45 43 50 46 99).
You may also reach Dr. John Russ via e-mail at John_Russ@NCSU.edu.
Course Outline
Image Acquisition and Storage: Video and Slow Scan Methods;
Monochrome and Color; Printing and Storage
Image Processing: Correction of Defects; Isolation of Features;
Spatial and Frequency Domains
Discrimination & Binary images: Thresholding; Morphological
Operations; Boolean Operations
Measurement: Global Image Properties; Feature Size, Shape,
Position, Brightness; Densitometry and Color Measurement
Interpretation: Stereology; Sampling; Statistical Treatment
Feature Recognition: Artificial Intelligence Tools; Expert Systems,
Fuzzy Logic, Cluster Analysis, Neural Nets, Contextual Learning
Surface Measurements; Stereoscopy; Metrology; Roughness,
Fractal Dimensions
3-D Imaging: Serial Sections; Tomography; Reconstruction
______________________________________________________
+ John Russ +
+ (John_Russ@ncsu.edu) or (russ@mat.mte.ncsu.edu) +
+ Materials Science and Engineering Department, +
+ North Carolina State Univ., Raleigh, NC 27695-7907 +
+ phone: 919-515-3328 fax: 919-515-7724 +
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~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Bonnie Blackwell, bonn@qcvaxa.acc.qc.edu
Dept of Geology, (718) 997-3332
Queens College, City University of New York, fax: 997-3349
Flushing, NY 11367-1597
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